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How Xilinx Chips Quickly Check If Memory Is Completely Erased

A method for programmable chips to instantly verify that all memory cells are wiped clean using a simple, high-speed logic gate circuit.

Granted 1996ExpiredExpired 2015Owned by Xilinx IncInvented by Derek R. Curd

Original patent title: “High-speed minimal logic self blank checking method for programmable logic device

Plain-English explanation by SahiLast reviewed · June 13, 2026

A method for programmable chips to instantly verify that all memory cells are wiped clean using a simple, high-speed logic gate circuit. Granted to Xilinx Inc in 1996 with 24 claims and 5 forward citations, and it is now in the public domain.

Coverage

What does this patent actually cover?

This patent describes a hardware circuit designed to verify if memory cells in a programmable logic device (PLD) are fully erased. It uses an n-input NOR gate formed by NMOS transistors connected to sense amplifiers. When a wordline is activated, the circuit checks all memory cells on that line simultaneously. If any single cell is not fully erased, its sense amplifier outputs a high signal, which turns on an NMOS transistor and pulls the common output node low, signaling that the device is not yet clean.

The gap

What does this patent NOT cover?

  • Does not cover software-based verification methods that check memory cells one by one.
  • Does not cover memory architectures that do not use sense amplifiers as input sources for the gate.
  • Does not cover non-volatile memory technologies that do not utilize wordline-based addressing.

These exclusions are unique to PatentBrief — derived from the actual claim language, not patent-office boilerplate.

Key facts

Patent numberUS 5561631
StatusExpired
FieldSemiconductors & Chips
AssigneeXilinx Inc
InventorDerek R. Curd
Filed1995
Granted1996
Expires2015 (expired)
Claims24
Times cited5
LitigationNone on record
Value · $7K$22KMinimal

What made this novel

Instead of reading each cell individually, the circuit uses the physical properties of a NOR gate to perform a parallel 'all-or-nothing' check, where a single un-erased cell immediately forces the output to a 'not erased' state.

The Patent Drawing

Representative patent drawing for High-speed minimal logic self blank checking method for programmable logic device (US 5561631)
Representative figure · US 5561631All figures on Google Patents →
High-speed minimal logic self …(Primary claim)semiconductorsmechanical

Schematic visualization of the patent's claim structure. Hand-drawn diagrams in progress for each landmark patent.

Where you've seen this

Real-world examples

01

Xilinx FPGA configuration memory

02

Programmable logic device (PLD) erasure cycles

03

High-density memory array testing

Why it matters

The bigger picture

Before this, checking if a large programmable chip was fully erased could be a slow, iterative process. By implementing this logic gate directly into the hardware, Xilinx made the erasure verification process nearly instantaneous, which is critical for manufacturing efficiency and device reliability in field-programmable gate arrays (FPGAs).

Filed

March 3, 1995

Granted

October 1, 1996

Market context

Who's building on this

Companies in this space

Xilinx, now part of AMD, remains a leader in FPGA technology. The fundamental principles of efficient memory testing and configuration verification are standard in modern high-density programmable logic devices produced by companies like Intel (formerly Altera) and Lattice Semiconductor.

Market impact

This patent helped standardize high-speed verification in the FPGA industry, allowing manufacturers to reduce testing time during production. It enabled the reliable scaling of programmable devices by ensuring that configuration memory could be cleared and verified rapidly without bottlenecking the manufacturing flow.

Claim 1 — Plain English

What this patent covers

This patent describes a hardware circuit designed to verify if memory cells in a programmable logic device (PLD) are fully erased. It uses an n-input NOR gate formed by NMOS transistors connected to sense amplifiers. When a wordline is activated, the circuit checks all memory cells on that line simultaneously. If any single cell is not fully erased, its sense amplifier outputs a high signal, which turns on an NMOS transistor and pulls the common output node low, signaling that the device is not yet clean.

The clever bit

Instead of reading each cell individually, the circuit uses the physical properties of a NOR gate to perform a parallel 'all-or-nothing' check, where a single un-erased cell immediately forces the output to a 'not erased' state.

What it does not cover

  • Does not cover software-based verification methods that check memory cells one by one.
  • Does not cover memory architectures that do not use sense amplifiers as input sources for the gate.
  • Does not cover non-volatile memory technologies that do not utilize wordline-based addressing.

Patent timeline

Filing

Application submitted to the patent office

Publication

Application published, typically 18 months after filing

Grant

Patent officially issued

Expiration

Patent enters public domain

This patent is in the public domain

See the Freedom to Build guide — what is free to use, what is not, and how to cite this patent.

View guide →

PatentBrief Score

Impact Score

Early stage

Citation count

16/40

Early citations

Claim breadth

16/20

Broad claimsclaimsThe numbered statements at the end of a patent that legally define what the inventor owns.Read more →

Recency

0/20

Older than 20 years

Assignee scale

0/20

Independent or smaller assigneeassigneeThe entity that owns the patent — usually the inventor's employer or a company.Read more →

PatentBrief Impact Score — based on citation count, claim breadth, recency, and assignee scale. Not a legal assessment.

Heuristic Value Estimate

What this patent might be worth

Minimal

$7K$22K

Midpoint $14K · expired or expiring · industry ×1.4

Adjust inputs →

Heuristic only — blends forward/backward citation counts, claim scope, time remaining, litigation history, and CPC-derived industry baseline. Real valuations need a professional appraisal.

Patent Claims

0 independent claims · 1 dependent

Claims are the legal boundaries of the patent. An independent claim stands alone. A dependent claim adds limitations to its parent, narrowing — but not broadening — the scope.

The original legal language

Original claims

24 claims as filed with the patent office.

Concepts involved

ClaimPrior artNon-obviousnessNoveltySpecificationAssigneePatent term

Citations

Patent lineage

Cites earlier patents

4

earlier patents this invention cites as foundations

View prior art →

Cited by later patents

5

later patents that build on this invention

View patents →

Cite this patent

Curd, D. R. (1996). How Xilinx Chips Quickly Check If Memory Is Completely Erased (U.S. Patent No. 5,561,631). U.S. Patent and Trademark Office. https://patentbrief.org/patent/us/5561631/high-speed-minimal-logic-self-blank-checking-method-for-programmable-logic-device

Auto-generated from the patent record. Double-check author order and the issue date against the official USPTO document before submitting.

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Common Questions

Frequently Asked Questions

What does How Xilinx Chips Quickly Check If Memory Is Completely Erased cover?

A method for programmable chips to instantly verify that all memory cells are wiped clean using a simple, high-speed logic gate circuit.

Who owns patent US 5561631?

Xilinx Inc owns this patent, granted in 1996.

When does this patent expire?

This patent has expired and is now in the public domain — anyone can use the invention freely.

What is patent US 5561631 cited by?

This patent has been cited by 5 later patents that build on its ideas.

What problem does this patent solve?

Before this, checking if a large programmable chip was fully erased could be a slow, iterative process. By implementing this logic gate directly into the hardware, Xilinx made the erasure verification process nearly instantaneous, which is critical for manufacturing efficiency and device reliability in field-programmable gate arrays (FPGAs).

What does this patent NOT cover?

Does not cover software-based verification methods that check memory cells one by one.

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Last reviewed: June 13, 2026 · PatentBrief is not a law firm and this is not legal advice.