Making Better Carbon Hardmasks for Chip Manufacturing
This patent describes a method for creating special carbon layers, called hardmasks, used in making computer chips, by using a unique plasma process that makes them stronger and easier to remove.
Original patent title: “High selectivity, low stress, and low hydrogen carbon hardmasks in low-pressure conditions with wide gap electrode spacing”
This patent describes a method for creating special carbon layers, called hardmasks, used in making computer chips, by using a unique plasma process that makes them stronger and easier to remove. Granted in 2026.
Coverage
What does this patent actually cover?
This patent describes methods and equipment for depositing an ashable hard mask (AHM) onto a substrate, typically a silicon wafer. The core mechanism involves using a plasma process with a specific setup: a "wide gap electrode spacing" in "low-pressure conditions." This combination helps to control unwanted plasma formations, known as "parasitic plasmas," which can otherwise degrade the quality of the deposited layer. By controlling these plasmas, the method enables the creation of AHMs that have "high selectivity" (meaning they protect underlying materials very well during etching), "low stress" (less prone to cracking or warping), and "low hydrogen" content (making them easier to remove later). For example, this process could be used to deposit a carbon hardmask onto a silicon wafer before etching tiny, intricate patterns for a new generation of microprocessors.
The gap
What does this patent NOT cover?
- Does not cover hardmasks made from materials other than carbon, such as silicon dioxide or silicon nitride.
- Does not cover deposition processes that use narrow electrode spacing or high-pressure conditions.
- Does not cover hardmasks that are not 'ashable' or easily removed after their purpose is served.
- Does not cover the actual etching of features into the underlying substrate, only the deposition of the protective mask.
- Does not cover methods for depositing hardmasks without controlling parasitic plasmas.
These exclusions are unique to PatentBrief — derived from the actual claim language, not patent-office boilerplate.
Key facts
What made this novel
The clever part is identifying that combining a 'wide gap electrode spacing' with 'low-pressure conditions' effectively controls 'parasitic plasmas' during deposition. This specific combination allows for the creation of superior carbon hardmasks with properties like high selectivity and low stress, which are crucial for advanced chip fabrication.
Schematic visualization of the patent's claim structure. Hand-drawn diagrams in progress for each landmark patent.
Where you've seen this
Real-world examples
Semiconductor manufacturing
Microprocessor fabrication
Memory chip production (e.g., NAND flash, DRAM)
Advanced logic chip manufacturing
Why it matters
The bigger picture
Hardmasks are essential tools in the intricate process of manufacturing computer chips. Creating hardmasks with high selectivity, low stress, and low hydrogen content allows chipmakers to etch finer features more reliably and with fewer defects. This technology directly supports the continuous miniaturization and performance improvements seen in modern semiconductors, which power everything from smartphones to supercomputers.
Filed
December 13, 2021
Granted
September 15, 2026
Market context
Who's building on this
Companies in this space
While the original assigneeassigneeThe entity that owns the patent — usually the inventor's employer or a company.Read more → is unknown, the technology described is fundamental to semiconductor manufacturing equipment. Major players like Applied Materials, Lam Research, and Tokyo Electron are continuously developing and refining plasma deposition and etch systems that incorporate such innovations. These companies are at the forefront of creating the tools necessary for advanced hardmask processes used in chip fabrication.
Market impact
Improvements in hardmask technology directly enable the creation of smaller, more powerful, and more energy-efficient microchips. This patent's focus on high selectivity, low stress, and low hydrogen hardmasks helps overcome manufacturing challenges at advanced process nodes, allowing for continued miniaturization and performance gains in the semiconductor industry. It contributes to reducing defects and improving yield in chip fabrication, which is critical for profitability.
Claim 1 — Plain English
What this patent covers
This patent describes methods and equipment for depositing an ashable hard mask (AHM) onto a substrate, typically a silicon wafer. The core mechanism involves using a plasma process with a specific setup: a "wide gap electrode spacing" in "low-pressure conditions." This combination helps to control unwanted plasma formations, known as "parasitic plasmas," which can otherwise degrade the quality of the deposited layer. By controlling these plasmas, the method enables the creation of AHMs that have "high selectivity" (meaning they protect underlying materials very well during etching), "low stress" (less prone to cracking or warping), and "low hydrogen" content (making them easier to remove later). For example, this process could be used to deposit a carbon hardmask onto a silicon wafer before etching tiny, intricate patterns for a new generation of microprocessors.
The clever bit
The clever part is identifying that combining a 'wide gap electrode spacing' with 'low-pressure conditions' effectively controls 'parasitic plasmas' during deposition. This specific combination allows for the creation of superior carbon hardmasks with properties like high selectivity and low stress, which are crucial for advanced chip fabrication.
What it does not cover
- Does not cover hardmasks made from materials other than carbon, such as silicon dioxide or silicon nitride.
- Does not cover deposition processes that use narrow electrode spacing or high-pressure conditions.
- Does not cover hardmasks that are not 'ashable' or easily removed after their purpose is served.
- Does not cover the actual etching of features into the underlying substrate, only the deposition of the protective mask.
- Does not cover methods for depositing hardmasks without controlling parasitic plasmas.
Patent timeline
Application submitted to the patent office
Patent officially issued
PatentBrief Score
Impact Score
Early stage
Citation count
0/40
No citations yet
Claim breadth
0/20
Narrow claimsclaimsThe numbered statements at the end of a patent that legally define what the inventor owns.Read more →
Recency
20/20
Granted within 5 years
Assignee scale
0/20
Independent or smaller assigneeassigneeThe entity that owns the patent — usually the inventor's employer or a company.Read more →
PatentBrief Impact Score — based on citation count, claim breadth, recency, and assignee scale. Not a legal assessment.
Heuristic Value Estimate
What this patent might be worth
$29K – $92K
Midpoint $58K · 15.2 yr remaining · industry ×2.4
Heuristic only — blends forward/backward citation counts, claim scope, time remaining, litigation history, and CPC-derived industry baseline. Real valuations need a professional appraisal.
Claim text not yet imported for this patent
Concepts involved
Cite this patent
(2026). Making Better Carbon Hardmasks for Chip Manufacturing (U.S. Patent No. 12,735,785). U.S. Patent and Trademark Office. https://patentbrief.org/patent/us/12735785/high-selectivity-low-stress-and-low-hydrogen-carbon-hardmasks-in-low-pressure
Auto-generated from the patent record. Double-check author order and the issue date against the official USPTO document before submitting.
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Common Questions
Frequently Asked Questions
What does Making Better Carbon Hardmasks for Chip Manufacturing cover?
This patent describes a method for creating special carbon layers, called hardmasks, used in making computer chips, by using a unique plasma process that makes them stronger and easier to remove.
When does this patent expire?
This patent is expected to expire on September 15, 2046, when the invention enters the public domain.
What problem does this patent solve?
Hardmasks are essential tools in the intricate process of manufacturing computer chips. Creating hardmasks with high selectivity, low stress, and low hydrogen content allows chipmakers to etch finer features more reliably and with fewer defects. This technology directly supports the continuous miniaturization and performance improvements seen in modern semiconductors, which power everything from smartphones to supercomputers.
What does this patent NOT cover?
Does not cover hardmasks made from materials other than carbon, such as silicon dioxide or silicon nitride.
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