Making Microchips with a Silicon-Containing Photoresist Layer
This patent describes a method for precisely creating tiny patterns on microchips using a special light-sensitive material, called a photoresist, that contains silicon and changes its properties when exposed to light.
Patent Number
US 10281819
Status
Active
Filing Date
December 11, 2017
Grant Date
May 7, 2019
Expiration
December 11, 2037
Claims
22
Assignee
Taiwan Semiconductor Manufacturing Co TSMC
Inventors
Li-Yen Lin, Ching-Yu Chang
Citations
0 forward · 26 backward
What it covers
This patent describes a method for creating extremely small patterns on a substrate, like a silicon wafer for computer chips. First, a base polymeric material layer is applied to the substrate, then a photoresist layer is formed on top of it (Claim 1). This photoresist is special because it includes a polymer backbone, an acid labile group (ALG) that has a silicon-containing unit attached, and a photo-acid generator (PAG) (Claim 1). When light (radiation) hits the photoresist, the PAG creates acid, which then reacts with the ALG, changing the photoresist's chemical properties, for example, from nonpolar to polar (Claim 12). This change allows specific parts of the photoresist to be washed away during a developing process, leaving behind a precise pattern (Claim 3). Crucially, the base layer and the photoresist layer are designed to have different optical properties, like how they reflect or absorb light, which helps improve the patterning accuracy (Claim 11).
What it doesn't cover
- —Photoresists that do not include a silicon-containing unit chemically bonded to an acid labile group.
- —Methods where the acid labile group is not norbornane, adamantine, or a derivative thereof.
- —Lithography processes that do not involve forming a photoresist layer over a separate polymeric material layer with different optical properties.
- —Photoresist compositions where the silicon-containing unit is not chemically bonded to the acid labile group.
- —Developing processes that remove unexposed portions of the photoresist, unless the exposing process changes the resist from polar to nonpolar (Claim 3 vs 13).
The clever bit
The novelty lies in chemically integrating a silicon-containing unit directly into the acid labile group of the photoresist polymer. This specific chemical structure, combined with the use of a separate optical layer, aims to improve patterning resolution and etching resistance for making smaller, more detailed features on microchips.
Why it matters
This patent is assigned to TSMC, a leading semiconductor manufacturer. The ability to create ever smaller and more precise patterns is fundamental to advancing microchip technology, allowing for more powerful and efficient processors. Photoresists are critical materials in this process, and innovations in their chemistry directly impact the limits of chip manufacturing. While this specific patent has no forward citations, it represents ongoing research into advanced photoresist materials needed for next-generation lithography.
Real-world examples
- 1.Advanced semiconductor manufacturing processes
- 2.EUV (Extreme Ultraviolet) lithography materials
- 3.Memory chip fabrication
- 4.Processor chip fabrication
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